MICROELECTRONICS RELIABILITY JCR impact factor overview
Automatically generated from the journal record shown on this page.
Clarivate JCR impact factor overview
MICROELECTRONICS RELIABILITY is listed in this directory with bibliometric information for 2025. It is published by PERGAMON-ELSEVIER SCIENCE LTD. The database records a Journal Impact Factor of 1.900, presented as a Clarivate Journal Citation Reports (JCR)-based metric. Its listed JCR Impact Factor quartile is Q3.
Ranking and quartile
The recorded JCR Impact Factor category rank is 226 out of 366 journals in its listed category. A Q3 designation describes the journal’s position within its subject category; it should not be used as a direct measure of the quality of an individual article.
Citation profile
The record contains 9,221 total citations, 165 total articles, 176 citable items. The five-year Impact Factor is 1.800, which is 0.100 points below the listed standard Journal Impact Factor. These values use different citation windows and should be interpreted together rather than as a direct trend. The Journal Impact Factor without journal self-citations is recorded as 1.700. The Journal Citation Indicator is listed as 0.320.
Citation half-life
The cited half-life is recorded as 8.2 years, describing the median age of articles cited in the reporting year. The citing half-life is 8.1 years, reflecting the median age of references used by the journal’s articles.
Journal identifiers and verification
MICROELECTRONICS RELIABILITY is identified in this record by print ISSN 0026-2714 and electronic ISSN 1872-941X. Use the ISSN when checking library catalogues, publisher records, indexing databases, or the official Clarivate Journal Citation Reports entry.
Complete journal information
All values below come directly from the database record.
| Journal name | MICROELECTRONICS RELIABILITY |
|---|---|
| Abbreviated journal | MICROELECTRON RELIAB |
| Publisher | PERGAMON-ELSEVIER SCIENCE LTD |
| Metric year | 2025 |
| Overall rank | 8,733 |
| ISSN | 0026-2714 |
| eISSN | 1872-941X |
| Total cites | 9,221 |
| Total articles | 165 |
| Citable items | 176 |
| Cited half-life | 8.2 years |
| Citing half-life | 8.1 years |
| JCR-based Journal Impact Factor | 1.900 |
| 5-Year Impact Factor | 1.800 |
| Impact Factor without journal self-cites | 1.700 |
| Journal Citation Indicator | 0.320 |
| JCR Impact Factor quartile | Q3 |
| JCR category rank | 226/366 |
| Database record updated |
Frequently asked questions
What is the 2025 JCR-based Journal Impact Factor of MICROELECTRONICS RELIABILITY?
The Journal Impact Factor recorded in this directory as a Clarivate Journal Citation Reports (JCR)-based value for MICROELECTRONICS RELIABILITY is 1.900 for the 2025 metric year.
What quartile is MICROELECTRONICS RELIABILITY?
MICROELECTRONICS RELIABILITY is listed in quartile Q3. Quartiles describe a journal’s position within a subject category and should be interpreted within that field.
Who publishes MICROELECTRONICS RELIABILITY?
MICROELECTRONICS RELIABILITY is listed as being published by PERGAMON-ELSEVIER SCIENCE LTD.
Can a JCR Journal Impact Factor be used to judge an individual article?
No. The Journal Impact Factor is a journal-level citation measure reported in Clarivate Journal Citation Reports. It does not measure the quality, reliability or influence of every individual article published by that journal.
Related journal profiles
Additional records from the same publisher or with a similar listed JCR Impact Factor.