| Rank | 8733 |
|---|---|
| Abbreviated Journal | IEEE DES TEST |
| Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| Year | 2024 |
| ISSN | 2168-2356 |
| eISSN | 2168-2364 |
| Total Cites | 1388 |
| Total Articles | 46 |
| Citable Items | 46 |
| Cited Half-Life | 7.7 |
| Citing Half-Life | 6.3 |
| Impact Factor | 1.900 |
| 5-Year JIF | 1.900 |
| JIF Without Self-Cites | 1.900 |
| JCI | 0.400 |
| JIF Quartile | Q3 |
| JIF Rank | 226/366 |