Rank | 11740 |
---|---|
Abbreviated Journal | J ELECTRON TEST |
Publisher | SPRINGER |
Year | 2024 |
ISSN | 0923-8174 |
eISSN | 1573-0727 |
Total Cites | 549 |
Total Articles | 53 |
Citable Items | 53 |
Cited Half-Life | 6.4 |
Citing Half-Life | 8.3 |
Impact Factor | 1.300 |
5-Year JIF | 0.900 |
JIF Without Self-Cites | 1.200 |
JCI | 0.240 |
JIF Quartile | Q4 |
JIF Rank | 281/366 |